The Imaging and Analysis Center (IAC) offers high-end, state-of-the-art instrumentation and expertise for characterization of both hard and soft (including biological) materials for research and education. It is one of the most advanced materials characterization facilities in the world and is utilized by numerous departments across campus. IAC also collaborates with researchers in industry and other academic institutes. The IAC boasts a suite of Princeton University’s consolidated transmission (TEM) and scanning electron microscopes (SEM) that include both the premiere echelon hard materials TEM capable of resolving individual atoms and life science cryo-TEM used to reconstruct 3D atomic resolution protein structures. When combined with micro/nano chemical, thermal and structural analysis capabilities, a dual-beam focused ion beam system for materials manipulation, atomic force microscopes, X-ray diffractometers, 3D X-ray microscope, XPS/UPS, computer simulation and image processing capabilities, as well as materials preparation facilities, IAC has an unparalleled breadth and depth of imaging and analysis capabilities.
X ray microscopes
Transmission electron microscopy
Focused ion beams
X ray photoelectron spectroscopy