• 1748 Citations
  • 18 h-Index
1981 …2019

Research output per year

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Research Output

Estimating the number of equivalent mutants

Ayad, A., Marsit, I., Loh, J., Omri, M. N. & Mili, A., Apr 2019, Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019. Institute of Electrical and Electronics Engineers Inc., p. 112-121 10 p. 8728901. (Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019).

New Jersey Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 1 Scopus citations

    Fault Density, Fault Depth and Fault Multiplicity: The Reward of Discernment

    Khaireddine, B., Zakharchenko, A. & Mili, A., Jul 2019, Proceedings - Companion of the 19th IEEE International Conference on Software Quality, Reliability and Security, QRS-C 2019. Institute of Electrical and Electronics Engineers Inc., p. 532-533 2 p. 8859479. (Proceedings - Companion of the 19th IEEE International Conference on Software Quality, Reliability and Security, QRS-C 2019).

    New Jersey Institute of Technology

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Impact of mutation operators on mutant equivalence

    Marsit, I., Omri, M. N., Loh, J. M. & Mili, A., Jan 1 2019, ICSOFT 2018 - Proceedings of the 13th International Conference on Software Technologies. Maciaszek, L. & van Sinderen, M. (eds.). SciTePress, p. 21-32 12 p. (ICSOFT 2018 - Proceedings of the 13th International Conference on Software Technologies).

    New Jersey Institute of Technology

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 1 Scopus citations

    Program repair at arbitrary fault depth

    Khaireddine, B., Martinez, M. & Mili, A., Apr 2019, Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation, ICST 2019. Institute of Electrical and Electronics Engineers Inc., p. 465-472 8 p. 8730184. (Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation, ICST 2019).

    New Jersey Institute of Technology

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Quantitative metrics for mutation testing

    Ayad, A., Marsit, I., Loh, J., Omri, M. N. & Mili, A., Jan 1 2019, ICSOFT 2019 - Proceedings of the 14th International Conference on Software Technologies. van Sinderen, M. & Maciaszek, L. (eds.). SciTePress, p. 49-59 11 p. (ICSOFT 2019 - Proceedings of the 14th International Conference on Software Technologies).

    New Jersey Institute of Technology

    Research output: Chapter in Book/Report/Conference proceedingConference contribution