• 1183 Citations
  • 17 h-Index
1986 …2019

Research output per year

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Fingerprint Dive into the research topics where Durgamadhab Misra is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

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Projects

Research Output

Detection of cancer antigens (CA-125) using gold nano particles on interdigitated electrode-based microfluidic biosensor

Nunna, B. B., Mandal, D., Lee, J. U., Singh, H., Zhuang, S., Misra, D., Bhuyian, M. N. U. & Lee, E. S., Dec 1 2019, In : Nano Convergence. 6, 1, 3.

New Jersey Institute of Technology

Research output: Contribution to journalArticle

Open Access
  • 9 Scopus citations

    Multilevel resistive switching in Hf-based RRAM

    Jain, B., Huang, C. S., Misra, D., Tapily, K., Clark, R. D., Consiglio, S., Wajda, C. S. & Leusink, G. J., 2019, Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9. Roozeboom, F., Timans, P. J., Kakushima, K., Gusev, E. P., Karim, Z., Misra, D., Obeng, Y. S., De Gendt, S. & Jagannathan, H. (eds.). 3 ed. Electrochemical Society Inc., p. 39-44 6 p. (ECS Transactions; vol. 89, no. 3).

    New Jersey Institute of Technology

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 3 Scopus citations

    Preface

    Misra, D., De Gendt, S., Kilgore, S., Kita, K., Dayeh, S. & Kakushima, K., 2019, In : ECS Transactions. 92, 1, p. III

    New Jersey Institute of Technology

    Research output: Contribution to journalEditorial

    Preface

    Timans, P. J., Roozeboom, F., Kakushima, K., Gusev, E. P., Karim, Z., Misra, D., Obeng, Y., DeGendt, S. & Jagannathan, H., Jan 1 2019, In : ECS Transactions. 89, 3, p. III

    New Jersey Institute of Technology

    Research output: Contribution to journalEditorial

    Self-heating effects on hot carrier degradation and its impact on logic circuit reliability

    Paliwoda, P., Chbili, Z., Kerber, A., Nigam, T., Nagahiro, K., Cimino, S., Toledano-Luque, M., Pantisano, L., Min, B. W. & Misra, D., Jun 2019, In : IEEE Transactions on Device and Materials Reliability. 19, 2, p. 249-254 6 p., 8712418.

    New Jersey Institute of Technology

    Research output: Contribution to journalArticle

  • 2 Scopus citations