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Fingerprint Dive into the research topics where E Elsayed is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

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Testing Engineering & Materials Science
Degradation Engineering & Materials Science
Statistical process control Engineering & Materials Science
Inspection Engineering & Materials Science
Costs Engineering & Materials Science
Containers Engineering & Materials Science
Accelerated Life Testing Mathematics
Failure modes Engineering & Materials Science

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Research Output 1975 2020

Data description
Process monitoring
Covariance matrix
Monitoring
Tuning
Semiconductor materials
1 Citation (Scopus)
Monitoring
Probability distributions
Data structures
Statistics
Regularization

Bayesian framework for fault variable identification

Jeong, M. K. & Elsayed, E. A., Oct 2 2019, In : Journal of Quality Technology. 51, 4, p. 375-391 17 p.

Rutgers, The State University

Research output: Contribution to journalArticle

Normal distribution
Engineers
Fault
Normality
5 Citations (Scopus)
Statistical process control
Monitoring
Process monitoring
Process control
Control charts