Chen-Wiegart, Y. C. K., Williams, G., Zhao, C., Jiang, H., Li, L., Demkowicz, M., Seita, M., Short, M., Ferry, S., Wada, T., Kato, H., Chou, K. W., Petrash, S.,
Catalano, J., Yao, Y., Murphy, A., Zumbulyadis, N., Centeno, S. A., Dybowski, C. & Thieme, J.,
Aug 30 2016,
ICXOM23: International Conference on X-Ray Optics and Microanalysis. Thieme, J. & Siddons, D. P. (eds.).
American Institute of Physics Inc., 030004. (AIP Conference Proceedings; vol. 1764).
Montclair State University
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review