• 1746 Citations
  • 21 h-Index
19962019
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Fingerprint Dive into the research topics where Myong-Kee Jeong is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 13 Similar Profiles
Monitoring Engineering & Materials Science
Statistical process control Engineering & Materials Science
Feature extraction Engineering & Materials Science
Process monitoring Engineering & Materials Science
Support vector machines Engineering & Materials Science
Semiconductor materials Engineering & Materials Science
Data description Engineering & Materials Science
Data reduction Engineering & Materials Science

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Projects 2008 2015

Process monitoring
Image sensors
Failure analysis
Monitoring
Fault detection

Research Output 1996 2019

Decision trees
Defects
Semiconductor materials
Dynamic random access storage
Bins

An adaptive thresholding-based process variability monitoring

Abdella, G. M., Kim, J., Kim, S., Al-Khalifa, K. N., Jeong, M-K., Hamouda, A. M. & Elsayed, E., Jul 3 2019, In : Journal of Quality Technology. 51, 3, p. 242-256 15 p.

Rutgers, The State University

Research output: Contribution to journalArticle

Process monitoring
Covariance matrix
Monitoring
Tuning
Semiconductor materials
1 Citation (Scopus)
Monitoring
Probability distributions
Data structures
Statistics
Regularization

Bayesian framework for fault variable identification

Turkoz, M., Kim, S., Jeong, Y. S., Jeong, M-K., Elsayed, E., Al-Khalifa, K. N. & Hamouda, A. M., Oct 2 2019, In : Journal of Quality Technology. 51, 4, p. 375-391 17 p.

Rutgers, The State University

Research output: Contribution to journalArticle

Normal distribution
Engineers
Fault
Normality

Dependence-biased clustering for variable selection with random forests

Gazzola, G. & Jeong, M-K., Dec 1 2019, In : Pattern Recognition. 96, 106980.

Rutgers, The State University

Research output: Contribution to journalArticle