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Myong-Kee Jeong

Rutgers, The State University

    • 1746 Citations
    • 21 h-Index
    19962019
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    • 13 Similar Profiles
    Monitoring Engineering & Materials Science
    Statistical process control Engineering & Materials Science
    Feature extraction Engineering & Materials Science
    Process monitoring Engineering & Materials Science
    Support vector machines Engineering & Materials Science
    Semiconductor materials Engineering & Materials Science
    Data description Engineering & Materials Science
    Data reduction Engineering & Materials Science

    Network Recent external collaboration on country level. Dive into details by clicking on the dots.

    Projects 2008 2015

    Collaborative Research: Process Monitoring And Control In Autocorrelated Multistage Manufacturing Processes

    Jeong, M.

    National Science Foundation (NSF)

    9/1/12 → 8/31/15

    Rutgers, The State University

    Project: Research project

    Process monitoring
    Process control
    Monitoring
    Industry
    Chemical industry

    Career: Process Monitoring, Identification, And Diagnosis Using Image And Functional Data

    Jeong, M.

    National Science Foundation (NSF)

    7/1/08 → 6/30/12

    Rutgers, The State University

    Project: Research project

    Process monitoring
    Image sensors
    Failure analysis
    Monitoring
    Fault detection

    Research Output 1996 2019

    A generalised uncertain decision tree for defect classification of multiple wafer maps

    Kim, B., Jeong, Y. S., Tong, S. H. & Jeong, M-K., Jan 1 2019, In : International Journal of Production Research.

    Rutgers, The State University

    Research output: Contribution to journal › Article

    Decision trees
    Defects
    Semiconductor materials
    Dynamic random access storage
    Bins

    An adaptive thresholding-based process variability monitoring

    Abdella, G. M., Kim, J., Kim, S., Al-Khalifa, K. N., Jeong, M-K., Hamouda, A. M. & Elsayed, E., Jul 3 2019, In : Journal of Quality Technology. 51, 3, p. 242-256 15 p.

    Rutgers, The State University

    Research output: Contribution to journal › Article

    Process monitoring
    Covariance matrix
    Monitoring
    Tuning
    Semiconductor materials
    1 Citation (Scopus)

    A penalized likelihood-based quality monitoring via L2-norm regularization for high-dimensional processes

    Kim, S., Jeong, M-K. & Elsayed, E., Jan 1 2019, In : Journal of Quality Technology.

    Rutgers, The State University

    Research output: Contribution to journal › Article

    Monitoring
    Probability distributions
    Data structures
    Statistics
    Regularization

    Bayesian framework for fault variable identification

    Turkoz, M., Kim, S., Jeong, Y. S., Jeong, M-K., Elsayed, E., Al-Khalifa, K. N. & Hamouda, A. M., Oct 2 2019, In : Journal of Quality Technology. 51, 4, p. 375-391 17 p.

    Rutgers, The State University

    Research output: Contribution to journal › Article

    Normal distribution
    Engineers
    Fault
    Normality

    Dependence-biased clustering for variable selection with random forests

    Gazzola, G. & Jeong, M-K., Dec 1 2019, In : Pattern Recognition. 96, 106980.

    Rutgers, The State University

    Research output: Contribution to journal › Article