• 108 Citations
  • 5 h-Index
19962006
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Fingerprint Dive into the research topics where Oktay Gokce is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 5 Similar Profiles
emissivity Physics & Astronomy
Silicon Chemical Compounds
silicon Physics & Astronomy
Oxygen Engineering & Materials Science
Temperature Engineering & Materials Science
Tungsten Chemical Compounds
Oxides Chemical Compounds
surface roughness Physics & Astronomy

Research Output 1996 2006

  • 108 Citations
  • 5 h-Index
  • 6 Article
  • 2 Conference article
10 Citations (Scopus)

Ion beam mixing for processing of nanostructure materials

Abedrabbo, S., Arafah, D. E., Gokce, O., Wielunski, L. S., Gharaibeh, M., Celik, O. & Ravindra, N. M., May 1 2006, In : Journal of Electronic Materials. 35, 5, p. 834-839 6 p.

New Jersey Institute of Technology

Research output: Contribution to journalArticle

Ion beams
Nanostructures
Germanium oxides
ion beams
germanium oxides
6 Citations (Scopus)

Electrical and compositional properties of TaSi2 films

Ravindra, N., Jin, L., Ivanov, D., Mehta, V. R., Dieng, L. M., Popov, G., Gokce, O., Grow, J. & Fiory, A. T., Jan 1 2002, In : Journal of Electronic Materials. 31, 10, p. 1074-1079 6 p., 45.

New Jersey Institute of Technology

Research output: Contribution to journalArticle

electrical properties
Tantalum
Sheet resistance
Steam
tantalum
62 Citations (Scopus)

Emissivity measurements and modeling of silicon-related materials: An overview

Ravindra, N. M., Sopori, B., Gokce, O. H., Cheng, S. X., Shenoy, A., Jin, L., Abedrabbo, S., Chen, W. & Zhang, Y., Jan 1 2001, In : International Journal of Thermophysics. 22, 5, p. 1593-1611 19 p.

New Jersey Institute of Technology

Research output: Contribution to journalArticle

emissivity
silicon
surface roughness
coatings
temperature
16 Citations (Scopus)

Effects of annealing on X-ray-amorphous CVD W-Si-N barrier layer materials

Gokce, O. H., Amin, S., Ravindra, N. M., Szostak, D. J., Paff, R. J., Fleming, J. G., Galewski, C. J., Shallenberger, J. & Eby, R., Sep 29 1999, In : Thin Solid Films. 353, 1, p. 149-156 8 p.

New Jersey Institute of Technology

Research output: Contribution to journalArticle

barrier layers
Vapors
Annealing
vapors
X rays

Issues in emissivity of silicon

Abedrabbo, S., Hensel, J. C., Gokce, O. H., Tong, F. M., Sopori, B., Fiory, A. T. & Ravindra, N. M., Jan 1 1998, In : Materials Research Society Symposium - Proceedings. 525, p. 95-102 8 p.

New Jersey Institute of Technology

Research output: Contribution to journalConference article

Silicon
emissivity
surface roughness
Surface roughness
silicon