Mommsen, R. K., Anderson, J., Angstadt, R., Babukhadia, L., Bhattacharjee, M., Blazey, G., Boeriu, O., Borcherding, F., Buehler, M., Connolly, B., Cooke, M., Corcoran, M., Desai, S., Evans, D.,
Gershtein, Y., Grannis, P., Grünendahl, S., Han, L., Hazen, E. & Heintz, U.
& 35 others,
Hensel, C., Hildreth, M., Hoeth, H., Hu, Y., Jabeen, S., Jain, V., Johnson, M., Khalatian, S., Khalatyan, N., Lincoln, D., Linn, S., Liu, Y., Lizarazo, J., Mackin, D., Maravin, Y., Martin, M., Mutaf, Y., Narain, M., Nöding, C., Olsen, J., Padley, P., Pangilinan, M., Partridge, R., Ramirez-Gomez, R., Rapisarda, S., Stevenson, K., Tomoto, M., Vachon, B., Wijnen, T., Wilcer, N., Wilson, G., Wu, S., Wyatt, T., Xu, Q. & Yip, K.,
Jan 1 2006,
2006 IEEE Nuclear Science Symposium - Conference Record. Institute of Electrical and Electronics Engineers Inc.,
p. 1396-1401 6 p. 4179275. (IEEE Nuclear Science Symposium Conference Record; vol. 3).
Rutgers, The State University
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution