TY - GEN
T1 - 4H-SiC MPS diode fabrication and characterization in an inductively loaded half-bridge inverter up to 100 kW
AU - Alexandrov, P.
AU - Wright, B.
AU - Pan, M.
AU - Weiner, M.
AU - Fursin, L.
AU - Zhao, J. H.
N1 - Publisher Copyright: © (2002) Trans Tech Publications, Switzerland.
PY - 2002
Y1 - 2002
N2 - In this work, 600K 4H-SiC MPS diodes were designed, fabricated and tested. The diodes were designed with a multi-step junction termination extension (MJTE) to improve the blocking voltage. The highest forward current capability of a packaged MPS diode showed a current of 50,4 at 2V and 140A at 4V. The SiC MPS diode reverse voltage showed excellent suppression of the Schottky leakage current at temperatures up to 250°C. Switching measurements using a half-bridge circuit, at currents up to 230A, showed a substantial reduction in diode dissipation, compared to a state of the art Si diode; a 47% energy loss reduction at room temperature(RT) and 84% at 200°C. The IGBT energy loss reduction, when using an MPS diode, was 15% at room temperature and 45% at 150°C. The diodes should result in improved efficiency when used in electric vehicles.
AB - In this work, 600K 4H-SiC MPS diodes were designed, fabricated and tested. The diodes were designed with a multi-step junction termination extension (MJTE) to improve the blocking voltage. The highest forward current capability of a packaged MPS diode showed a current of 50,4 at 2V and 140A at 4V. The SiC MPS diode reverse voltage showed excellent suppression of the Schottky leakage current at temperatures up to 250°C. Switching measurements using a half-bridge circuit, at currents up to 230A, showed a substantial reduction in diode dissipation, compared to a state of the art Si diode; a 47% energy loss reduction at room temperature(RT) and 84% at 200°C. The IGBT energy loss reduction, when using an MPS diode, was 15% at room temperature and 45% at 150°C. The diodes should result in improved efficiency when used in electric vehicles.
KW - Half-bridge inverter
KW - Schottky diodes
KW - pn junctions
UR - http://www.scopus.com/inward/record.url?scp=0036435412&partnerID=8YFLogxK
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U2 - https://doi.org/10.4028/www.scientific.net/MSF.389-393.1177
DO - https://doi.org/10.4028/www.scientific.net/MSF.389-393.1177
M3 - Conference contribution
SN - 9780878498949
T3 - Materials Science Forum
SP - 1177
EP - 1180
BT - Silicon Carbide and Related Materials 2001
A2 - Yoshida, S.
A2 - Nishino, S.
A2 - Harima, H.
A2 - Kimoto, T.
PB - Trans Tech Publications Ltd
T2 - International Conference on Silicon Carbide and Related Materials, ICSCRM 2001
Y2 - 28 October 2001 through 2 November 2001
ER -