A bivariate degradation model for sequence-dependent stress testing

Jingbo Guo, E. A. Elsayed

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Step-stress accelerated life/degradation testing is widely used in reliability estimation for highly reliable products. However it is limited since the reliability prediction model does not consider the effect of stress sequence in field environment. In this paper, we propose a sequence-dependent stress degradation model that considers the effect of stress sequence on the unit's degradation. We also consider dependent multiple degradation processes modeled as a multivariate degradation path. Approaches for the parameters' estimation of the reliability model are investigated and reliability metrics such as time-to-failure and mean residual life are obtained.

Original languageAmerican English
Title of host publicationProceedings - 21st ISSAT International Conference on Reliability and Quality in Design
EditorsHoang Pham
PublisherInternational Society of Science and Applied Technologies
Pages277-281
Number of pages5
ISBN (Electronic)9780991057627
StatePublished - 2015
Event21st ISSAT International Conference on Reliability and Quality in Design - Philadelphia, United States
Duration: Aug 6 2015Aug 8 2015

Publication series

NameProceedings - 21st ISSAT International Conference on Reliability and Quality in Design

Other

Other21st ISSAT International Conference on Reliability and Quality in Design
Country/TerritoryUnited States
CityPhiladelphia
Period8/6/158/8/15

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality

Keywords

  • Bivariate degradation paths
  • Reliability estimation
  • Sequence-dependent stress

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