A synthesis-based test generation and compaction algorithm for multifaults

Srinivas Devadas, Kurt Keutzer, Sharad Malik

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Several synthesis strategies are presented for the synthesis of flattenable and non-flattenable circuits for complete multifault testability, with associated compaction procedures. Experimental results are provided which indicate that a compacted multifault test set derived using these strategies can be significantly smaller than the test set derived using previously proposed procedures. These results also indicate the substantially wider applicability of these procedures, as compared to previous techniques.

Original languageEnglish (US)
Title of host publicationProceedings - Design Automation Conference
PublisherPubl by IEEE
Pages359-365
Number of pages7
ISBN (Print)0818691492
StatePublished - Jun 1 1991
Externally publishedYes
EventProceedings of the 28th ACM/IEEE Design Automation Conference - San Francisco, CA, USA
Duration: Jun 17 1991Jun 21 1991

Other

OtherProceedings of the 28th ACM/IEEE Design Automation Conference
CitySan Francisco, CA, USA
Period6/17/916/21/91

Fingerprint

Compaction
Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Devadas, S., Keutzer, K., & Malik, S. (1991). A synthesis-based test generation and compaction algorithm for multifaults. In Proceedings - Design Automation Conference (pp. 359-365). Publ by IEEE.
Devadas, Srinivas ; Keutzer, Kurt ; Malik, Sharad. / A synthesis-based test generation and compaction algorithm for multifaults. Proceedings - Design Automation Conference. Publ by IEEE, 1991. pp. 359-365
@inproceedings{fe69ace8b02549a08883b9aa92a568ee,
title = "A synthesis-based test generation and compaction algorithm for multifaults",
abstract = "Several synthesis strategies are presented for the synthesis of flattenable and non-flattenable circuits for complete multifault testability, with associated compaction procedures. Experimental results are provided which indicate that a compacted multifault test set derived using these strategies can be significantly smaller than the test set derived using previously proposed procedures. These results also indicate the substantially wider applicability of these procedures, as compared to previous techniques.",
author = "Srinivas Devadas and Kurt Keutzer and Sharad Malik",
year = "1991",
month = "6",
day = "1",
language = "English (US)",
isbn = "0818691492",
pages = "359--365",
booktitle = "Proceedings - Design Automation Conference",
publisher = "Publ by IEEE",

}

Devadas, S, Keutzer, K & Malik, S 1991, A synthesis-based test generation and compaction algorithm for multifaults. in Proceedings - Design Automation Conference. Publ by IEEE, pp. 359-365, Proceedings of the 28th ACM/IEEE Design Automation Conference, San Francisco, CA, USA, 6/17/91.

A synthesis-based test generation and compaction algorithm for multifaults. / Devadas, Srinivas; Keutzer, Kurt; Malik, Sharad.

Proceedings - Design Automation Conference. Publ by IEEE, 1991. p. 359-365.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - A synthesis-based test generation and compaction algorithm for multifaults

AU - Devadas, Srinivas

AU - Keutzer, Kurt

AU - Malik, Sharad

PY - 1991/6/1

Y1 - 1991/6/1

N2 - Several synthesis strategies are presented for the synthesis of flattenable and non-flattenable circuits for complete multifault testability, with associated compaction procedures. Experimental results are provided which indicate that a compacted multifault test set derived using these strategies can be significantly smaller than the test set derived using previously proposed procedures. These results also indicate the substantially wider applicability of these procedures, as compared to previous techniques.

AB - Several synthesis strategies are presented for the synthesis of flattenable and non-flattenable circuits for complete multifault testability, with associated compaction procedures. Experimental results are provided which indicate that a compacted multifault test set derived using these strategies can be significantly smaller than the test set derived using previously proposed procedures. These results also indicate the substantially wider applicability of these procedures, as compared to previous techniques.

UR - http://www.scopus.com/inward/record.url?scp=0026175522&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026175522&partnerID=8YFLogxK

M3 - Conference contribution

SN - 0818691492

SP - 359

EP - 365

BT - Proceedings - Design Automation Conference

PB - Publ by IEEE

ER -

Devadas S, Keutzer K, Malik S. A synthesis-based test generation and compaction algorithm for multifaults. In Proceedings - Design Automation Conference. Publ by IEEE. 1991. p. 359-365