Aliasing in a linear FSM used as a multiple-input signature analyzer under uniform and non-uniform error models

Sandeep Bhatia, Alexander Albicki, Niraj K. Jha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A time-proven method for analyzing the response of a circuit under test is to use a response compression technique, such as a linear feedback shift register (LFSR) used as a signature analyser. Most of the previous work on analysis of signature analysers assume a feedback register structure, and are based on complex coding and simulation results. In this paper, a much simpler model for computing the aliasing probability for any linear finite state machine (LFSM) used as a multiple-input signature analyzer (MISA) is presented. It is shown that the whole class of cyclic LFSM's has identical transient as well as steady-state aliasing probability under the uniform error model as that of any LFSR when used as an MISA. Some other functional circuits, such as accumulators, can also be used for data compression with similar performance as that of any LFSR. Finally, the steady-state aliasing probability is derived for an LFSM used as an MISA under arbitrary error models.

Original languageEnglish (US)
Title of host publication1992 IEEE International Symposium on Circuits and Systems, ISCAS 1992
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages427-430
Number of pages4
ISBN (Electronic)0780305930
DOIs
StatePublished - Jan 1 1992
Event1992 IEEE International Symposium on Circuits and Systems, ISCAS 1992 - San Diego, United States
Duration: May 10 1992May 13 1992

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume1

Conference

Conference1992 IEEE International Symposium on Circuits and Systems, ISCAS 1992
CountryUnited States
CitySan Diego
Period5/10/925/13/92

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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    Bhatia, S., Albicki, A., & Jha, N. K. (1992). Aliasing in a linear FSM used as a multiple-input signature analyzer under uniform and non-uniform error models. In 1992 IEEE International Symposium on Circuits and Systems, ISCAS 1992 (pp. 427-430). [229922] (Proceedings - IEEE International Symposium on Circuits and Systems; Vol. 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISCAS.1992.229922