Application regime and distortion metric for multivariate RF photonics

A. N. Tait, T. Ferreira De Lima, M. P. Chang, M. A. Nahmias, B. J. Shastri, Paul Richard Prucnal

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Photonic weight banks employing multivariate statistical techniques could extend performance limits of multiantenna radio systems. We characterize the aggregate bandwidth penalty imposed by a silicon microring weight bank and assess application regimes for multivariate RF photonics.

Original languageEnglish (US)
Title of host publication6th IEEE Photonics Society Optical Interconnects Conference, OI 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages25-26
Number of pages2
ISBN (Electronic)9781509050154
DOIs
StatePublished - Jun 30 2017
Event6th IEEE Photonics Society Optical Interconnects Conference, OI 2017 - Santa Fe, United States
Duration: Jun 5 2017Jun 7 2017

Publication series

Name6th IEEE Photonics Society Optical Interconnects Conference, OI 2017

Other

Other6th IEEE Photonics Society Optical Interconnects Conference, OI 2017
CountryUnited States
CitySanta Fe
Period6/5/176/7/17

Fingerprint

Photonics
photonics
Radio systems
Silicon
penalties
bandwidth
Bandwidth
silicon

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

Tait, A. N., Ferreira De Lima, T., Chang, M. P., Nahmias, M. A., Shastri, B. J., & Prucnal, P. R. (2017). Application regime and distortion metric for multivariate RF photonics. In 6th IEEE Photonics Society Optical Interconnects Conference, OI 2017 (pp. 25-26). [7965513] (6th IEEE Photonics Society Optical Interconnects Conference, OI 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/OIC.2017.7965513
Tait, A. N. ; Ferreira De Lima, T. ; Chang, M. P. ; Nahmias, M. A. ; Shastri, B. J. ; Prucnal, Paul Richard. / Application regime and distortion metric for multivariate RF photonics. 6th IEEE Photonics Society Optical Interconnects Conference, OI 2017. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 25-26 (6th IEEE Photonics Society Optical Interconnects Conference, OI 2017).
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author = "Tait, {A. N.} and {Ferreira De Lima}, T. and Chang, {M. P.} and Nahmias, {M. A.} and Shastri, {B. J.} and Prucnal, {Paul Richard}",
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Tait, AN, Ferreira De Lima, T, Chang, MP, Nahmias, MA, Shastri, BJ & Prucnal, PR 2017, Application regime and distortion metric for multivariate RF photonics. in 6th IEEE Photonics Society Optical Interconnects Conference, OI 2017., 7965513, 6th IEEE Photonics Society Optical Interconnects Conference, OI 2017, Institute of Electrical and Electronics Engineers Inc., pp. 25-26, 6th IEEE Photonics Society Optical Interconnects Conference, OI 2017, Santa Fe, United States, 6/5/17. https://doi.org/10.1109/OIC.2017.7965513

Application regime and distortion metric for multivariate RF photonics. / Tait, A. N.; Ferreira De Lima, T.; Chang, M. P.; Nahmias, M. A.; Shastri, B. J.; Prucnal, Paul Richard.

6th IEEE Photonics Society Optical Interconnects Conference, OI 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 25-26 7965513 (6th IEEE Photonics Society Optical Interconnects Conference, OI 2017).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Tait AN, Ferreira De Lima T, Chang MP, Nahmias MA, Shastri BJ, Prucnal PR. Application regime and distortion metric for multivariate RF photonics. In 6th IEEE Photonics Society Optical Interconnects Conference, OI 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 25-26. 7965513. (6th IEEE Photonics Society Optical Interconnects Conference, OI 2017). https://doi.org/10.1109/OIC.2017.7965513