@article{05e1c28840494a1cb617369956e80ea1,
title = "Applied Surface Science: Preface",
author = "J. Murota and B. Tillack and M. Caymax and J. Sturm and Y. Yasuda and S. Zaima",
note = "Funding Information: This special issue of Applied Surface Science contains the papers presented at the First International SiGe Technology and Device Meeting (ISTDM), held at the Nagoya University Symposion, Nagoya, Japan, from 15th to 17th January 2003. The goal of ISTDM was for many active researchers from around the world to discuss various issues concerning SiGe materials, processes, devices, and circuit technology. This meeting was sponsored by the Center for Cooperative Research in Advanced Science & Technology (Nagoya University) and the Laboratory for Electronic Intelligent Systems (Research Institute of Electrical Communication, Tohoku University). The meeting was cosponsored by the Association of Super-Advanced Electronics technologies, the 154th Committee on Semiconductor Interfaces and Their Applications (Japan Society for the Promotion of Science), the Technical Committee on Electronic Materials (The Institute of Electrical Engineers of Japan), and the Nagoya University Foundation. Copyright: Copyright 2019 Elsevier B.V., All rights reserved.",
year = "2004",
month = mar,
day = "15",
doi = "10.1016/j.apsusc.2003.08.085",
language = "American English",
volume = "224",
pages = "1--2",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier",
number = "1-4",
}