Atomic force microscopy - Scanning electrochemical microscopy (AFM-SECM) for nanoscale topographical and electrochemical characterization: Principles, applications and perspectives

Xiaonan Shi, Weihua Qing, Taha Marhaba, Wen Zhang

Research output: Contribution to journalReview article

Abstract

Atomic Force Microscopy-Scanning Electrochemical Microscopy (AFM-SECM) has evolved to be a powerful tool for simultaneous topographical-electrochemical measurements at local material surfaces with high spatial resolution. Such measurements are crucial for understanding structure-activity relationships relevant to a wide range of applications in material science, life science and chemical processes. AFM-SECM integrates classic SECM and AFM to achieve on-step acquisition of unparalleled high-spatial-resolution surface topology and nanoscale electrochemical images and holds promising potential to unveil fundamental interfacial properties or activity at nanoscale. Despite the rapid development of AFM-SECM, its unique principles, capabilities, and applications have not been sufficiently understood and utilized. The present review provides a short critical overview of the evolution of AFM-SECM, the major principles and operation modes as well as the AFM-SECM probe designs. The current applications of AFM-SECM in materials, biological and chemical sciences are critically discussed to highlight the remaining challenges of the AFM-SECM and perspectives on its further development.

Original languageEnglish (US)
Article number135472
JournalElectrochimica Acta
Volume332
DOIs
StatePublished - Feb 1 2020

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Atomic force microscopy
Microscopic examination
Scanning
Materials science
Biological materials
Topology

All Science Journal Classification (ASJC) codes

  • Chemical Engineering(all)
  • Electrochemistry

Keywords

  • Atomic force microscopy
  • Electrochemical characterization
  • Electrochemistry
  • Scanning electrochemical microscopy

Cite this

@article{c4a73d5ecc684fb9ba43b332404bf981,
title = "Atomic force microscopy - Scanning electrochemical microscopy (AFM-SECM) for nanoscale topographical and electrochemical characterization: Principles, applications and perspectives",
abstract = "Atomic Force Microscopy-Scanning Electrochemical Microscopy (AFM-SECM) has evolved to be a powerful tool for simultaneous topographical-electrochemical measurements at local material surfaces with high spatial resolution. Such measurements are crucial for understanding structure-activity relationships relevant to a wide range of applications in material science, life science and chemical processes. AFM-SECM integrates classic SECM and AFM to achieve on-step acquisition of unparalleled high-spatial-resolution surface topology and nanoscale electrochemical images and holds promising potential to unveil fundamental interfacial properties or activity at nanoscale. Despite the rapid development of AFM-SECM, its unique principles, capabilities, and applications have not been sufficiently understood and utilized. The present review provides a short critical overview of the evolution of AFM-SECM, the major principles and operation modes as well as the AFM-SECM probe designs. The current applications of AFM-SECM in materials, biological and chemical sciences are critically discussed to highlight the remaining challenges of the AFM-SECM and perspectives on its further development.",
keywords = "Atomic force microscopy, Electrochemical characterization, Electrochemistry, Scanning electrochemical microscopy",
author = "Xiaonan Shi and Weihua Qing and Taha Marhaba and Wen Zhang",
year = "2020",
month = "2",
day = "1",
doi = "https://doi.org/10.1016/j.electacta.2019.135472",
language = "English (US)",
volume = "332",
journal = "Electrochimica Acta",
issn = "0013-4686",
publisher = "Elsevier Limited",

}

TY - JOUR

T1 - Atomic force microscopy - Scanning electrochemical microscopy (AFM-SECM) for nanoscale topographical and electrochemical characterization

T2 - Principles, applications and perspectives

AU - Shi, Xiaonan

AU - Qing, Weihua

AU - Marhaba, Taha

AU - Zhang, Wen

PY - 2020/2/1

Y1 - 2020/2/1

N2 - Atomic Force Microscopy-Scanning Electrochemical Microscopy (AFM-SECM) has evolved to be a powerful tool for simultaneous topographical-electrochemical measurements at local material surfaces with high spatial resolution. Such measurements are crucial for understanding structure-activity relationships relevant to a wide range of applications in material science, life science and chemical processes. AFM-SECM integrates classic SECM and AFM to achieve on-step acquisition of unparalleled high-spatial-resolution surface topology and nanoscale electrochemical images and holds promising potential to unveil fundamental interfacial properties or activity at nanoscale. Despite the rapid development of AFM-SECM, its unique principles, capabilities, and applications have not been sufficiently understood and utilized. The present review provides a short critical overview of the evolution of AFM-SECM, the major principles and operation modes as well as the AFM-SECM probe designs. The current applications of AFM-SECM in materials, biological and chemical sciences are critically discussed to highlight the remaining challenges of the AFM-SECM and perspectives on its further development.

AB - Atomic Force Microscopy-Scanning Electrochemical Microscopy (AFM-SECM) has evolved to be a powerful tool for simultaneous topographical-electrochemical measurements at local material surfaces with high spatial resolution. Such measurements are crucial for understanding structure-activity relationships relevant to a wide range of applications in material science, life science and chemical processes. AFM-SECM integrates classic SECM and AFM to achieve on-step acquisition of unparalleled high-spatial-resolution surface topology and nanoscale electrochemical images and holds promising potential to unveil fundamental interfacial properties or activity at nanoscale. Despite the rapid development of AFM-SECM, its unique principles, capabilities, and applications have not been sufficiently understood and utilized. The present review provides a short critical overview of the evolution of AFM-SECM, the major principles and operation modes as well as the AFM-SECM probe designs. The current applications of AFM-SECM in materials, biological and chemical sciences are critically discussed to highlight the remaining challenges of the AFM-SECM and perspectives on its further development.

KW - Atomic force microscopy

KW - Electrochemical characterization

KW - Electrochemistry

KW - Scanning electrochemical microscopy

UR - http://www.scopus.com/inward/record.url?scp=85076579959&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85076579959&partnerID=8YFLogxK

U2 - https://doi.org/10.1016/j.electacta.2019.135472

DO - https://doi.org/10.1016/j.electacta.2019.135472

M3 - Review article

VL - 332

JO - Electrochimica Acta

JF - Electrochimica Acta

SN - 0013-4686

M1 - 135472

ER -