Biaxial zero creep measurements of interface energies in Ni/Ag multilayers

A. C. Lewis, A. B. Mann, D. Josell, J. Tapson, T. P. Weihs

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

Biaxial zero creep experiments were performed on Ni/Ag multilayer films on sapphire substrates. The equilibrium curvature was measured using a scanning laser and position sensitive photodetector. The experiments were designed to measure the free energy of Ni/Ag interfaces and to investigate their effect on the structural stability of multilayered materials. For the Ni/Ag multilayers studied, significant plastic straining occurs at temperatures above 400°C, enabling the growth stresses and thermal stresses in the multilayers to decay to zero. After a long time at elevated temperatures, the equilibrium curvature is reached for the film/substrate couple. This curvature is determined by the number and the energy of the Ni/Ag interfaces. Using this equilibrium technique, a free energy of 0.44 ± 0.03 N/m was measured for Ni/Ag interfaces at an equilibrium temperature of 550°C.

Original languageAmerican English
Pages (from-to)249-254
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume586
StatePublished - 2000
Externally publishedYes
EventInterfacial Engineering for Optimized Properties II - Boston, MA, USA
Duration: Dec 1 1999Dec 2 1999

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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