Characterization of MCM-48 materials

Kai Schumacher, Peter I. Ravikovitch, Alexander Du Chesne, Alexander V. Neimark, Klaus K. Unger

Research output: Contribution to journalArticle

230 Citations (Scopus)

Abstract

Mesoporous molecular sieves of MCM-48 type were prepared by conventional hydrothermal and novel room temperature syntheses. Scanning electron microscopy (SEM) studies have shown that nonagglomerated uniform spheres of size ca. 0.5 μm were obtained by the room temperature method. Internal pore structure was studied by X-ray diffraction (XRD), transmission electron microscopy (TEM), and high-resolution nitrogen and argon adsorption. Pore size distributions were calculated from low-temperature nitrogen and argon adsorption isotherms by the nonlocal density functional theory (NLDFT) method. A novel approach to calculating the pore wall thickness of MCM-48 from XRD and gas adsorption isotherms was employed. The approach utilizes intrinsic symmetry of MCM-48 pore structure, cubic Ia3d space group, revealed by XRD and combines the results of the pore size distribution analysis with general geometrical relations between structural parameters of the gyroid minimal surface. The pore wall thickness of MCM-48 calculated from both nitrogen and argon adsorption data was found to be ca. 8-10 angstrom, in good agreement with the estimates obtained from TEM.

Original languageEnglish (US)
Pages (from-to)4648-4654
Number of pages7
JournalLangmuir
Volume16
Issue number10
DOIs
StatePublished - Jan 1 2000

Fingerprint

Multicarrier modulation
Argon
Nitrogen
Pore structure
Adsorption isotherms
X ray diffraction
Pore size
Transmission electron microscopy
Adsorption
Gas adsorption
Molecular sieves
Temperature
Density functional theory
Scanning electron microscopy

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Materials Science(all)
  • Spectroscopy
  • Surfaces and Interfaces
  • Electrochemistry

Cite this

Schumacher, K., Ravikovitch, P. I., Du Chesne, A., Neimark, A. V., & Unger, K. K. (2000). Characterization of MCM-48 materials. Langmuir, 16(10), 4648-4654. https://doi.org/10.1021/la991595i
Schumacher, Kai ; Ravikovitch, Peter I. ; Du Chesne, Alexander ; Neimark, Alexander V. ; Unger, Klaus K. / Characterization of MCM-48 materials. In: Langmuir. 2000 ; Vol. 16, No. 10. pp. 4648-4654.
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Schumacher, K, Ravikovitch, PI, Du Chesne, A, Neimark, AV & Unger, KK 2000, 'Characterization of MCM-48 materials', Langmuir, vol. 16, no. 10, pp. 4648-4654. https://doi.org/10.1021/la991595i

Characterization of MCM-48 materials. / Schumacher, Kai; Ravikovitch, Peter I.; Du Chesne, Alexander; Neimark, Alexander V.; Unger, Klaus K.

In: Langmuir, Vol. 16, No. 10, 01.01.2000, p. 4648-4654.

Research output: Contribution to journalArticle

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Schumacher K, Ravikovitch PI, Du Chesne A, Neimark AV, Unger KK. Characterization of MCM-48 materials. Langmuir. 2000 Jan 1;16(10):4648-4654. https://doi.org/10.1021/la991595i