CMOS device reliability for emerging cryogenic space electronics applications

Chen Tianbing; Laleh Najafizadeh; Zhu Chendong; Adnan Ahmed; Ryan Diestelhorst; Gustavo Espinel; John D. Cressler

CMOS device reliability for emerging cryogenic space electronics applications

Chen Tianbing
, Laleh Najafizadeh
, Zhu Chendong
, Adnan Ahmed
, Ryan Diestelhorst
, Gustavo Espinel
, John D. Cressler

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	American English
Title of host publication	2005 International Semiconductor Device Research Symposium
Pages	328-329
Number of pages	2
State	Published - 2005
Externally published	Yes
Event	2005 International Semiconductor Device Research Symposium - Bethesda, MD, United States Duration: Dec 7 2005 → Dec 9 2005

Publication series

Name	2005 International Semiconductor Device Research Symposium
Volume	2005

Other

Other	2005 International Semiconductor Device Research Symposium
Country/Territory	United States
City	Bethesda, MD
Period	12/7/05 → 12/9/05

ASJC Scopus subject areas

General Engineering

Cite this

@inproceedings{6d80ee2c711449499bd5cb57b2861ea8,

title = "CMOS device reliability for emerging cryogenic space electronics applications",

author = "Chen Tianbing and Laleh Najafizadeh and Zhu Chendong and Adnan Ahmed and Ryan Diestelhorst and Gustavo Espinel and Cressler, \{John D.\}",

year = "2005",

language = "American English",

isbn = "1424400848",

series = "2005 International Semiconductor Device Research Symposium",

pages = "328--329",

booktitle = "2005 International Semiconductor Device Research Symposium",

note = "2005 International Semiconductor Device Research Symposium ; Conference date: 07-12-2005 Through 09-12-2005",

}

Tianbing, C, Najafizadeh, L, Chendong, Z, Ahmed, A, Diestelhorst, R, Espinel, G & Cressler, JD 2005, CMOS device reliability for emerging cryogenic space electronics applications. in 2005 International Semiconductor Device Research Symposium., 1596119, 2005 International Semiconductor Device Research Symposium, vol. 2005, pp. 328-329, 2005 International Semiconductor Device Research Symposium, Bethesda, MD, United States, 12/7/05.

CMOS device reliability for emerging cryogenic space electronics applications. / Tianbing, Chen; Najafizadeh, Laleh; Chendong, Zhu et al.
2005 International Semiconductor Device Research Symposium. 2005. p. 328-329 1596119 (2005 International Semiconductor Device Research Symposium; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - CMOS device reliability for emerging cryogenic space electronics applications

AU - Tianbing, Chen

AU - Najafizadeh, Laleh

AU - Chendong, Zhu

AU - Ahmed, Adnan

AU - Diestelhorst, Ryan

AU - Espinel, Gustavo

AU - Cressler, John D.

PY - 2005

Y1 - 2005

UR - https://www.scopus.com/pages/publications/33847217262

UR - https://www.scopus.com/pages/publications/33847217262#tab=citedBy

M3 - Conference contribution

SN - 1424400848

SN - 9781424400843

T3 - 2005 International Semiconductor Device Research Symposium

SP - 328

EP - 329

BT - 2005 International Semiconductor Device Research Symposium

T2 - 2005 International Semiconductor Device Research Symposium

Y2 - 7 December 2005 through 9 December 2005

ER -

CMOS device reliability for emerging cryogenic space electronics applications

Publication series

Other

ASJC Scopus subject areas

Other files and links

Cite this