Determining thickness independently from optical constants using ultrafast spectral interferometry

Feng Huang, John Federici, Dale Gary, Thomas Jedju, Warren S. Warren

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer.

Original languageAmerican English
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2005
PublisherOptical Society of America
ISBN (Print)1557527709, 9781557527707
StatePublished - 2005
EventConference on Lasers and Electro-Optics, CLEO 2005 - Baltimore, MD, United States
Duration: May 22 2005May 22 2005

Publication series

NameOptics InfoBase Conference Papers

Conference

ConferenceConference on Lasers and Electro-Optics, CLEO 2005
Country/TerritoryUnited States
CityBaltimore, MD
Period5/22/055/22/05

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this