Dielectric functions and critical points of BexZn1-xTe alloys measured by spectroscopic ellipsometry

M. R. Buckley, F. C. Peiris, O. Maksimov, M. Muñoz, M. C. Tamargo

Research output: Contribution to journalArticlepeer-review

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The complex dielectric function of a series of ternary BexZn1-xTe thin films for alloy concentrations between x=0.0 and x=0.52 was investigated using a rotating analyzer spectroscopic ellipsometer. A standard inversion technique was used to obtain the optical constants from the measured ellipsometric spectra. The results showed that the energy of the critical points with respect to Be concentration does not show any bowing effects unlike many other II-VI semiconductor ternary alloys.

Original languageEnglish (US)
Pages (from-to)5156-5158
Number of pages3
JournalApplied Physics Letters
Issue number27
StatePublished - Dec 30 2002
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)


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