Skip to main navigation Skip to search Skip to main content

Electrical characterization of dry and wet processed interface layer in Ge/High-K devices

  • Y. M. Ding
  • , D. Misra
  • , M. N. Bhuyian
  • , Kandabara Tapily
  • , Robert D. Clark
  • , Steve Consiglio
  • , Cory S. Wajda
  • , Gert J. Leusink

New Jersey Institute of Technology

Research output: Contribution to journal › Article › peer-review

6   Link opens in a new tab Scopus citations

Fingerprint

Dive into the research topics of 'Electrical characterization of dry and wet processed interface layer in Ge/High-K devices'. Together they form a unique fingerprint.
Sort by

Keyphrases

Engineering

Material Science