Electromechanical properties of lead-based ferroelectric thin films

A. L. Kholkin, K. G. Brooks, D. V. Taylor, N. Setter, A. Safari

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations


Piezoelectric properties of Pb(Zr,Ti)O3 (PZT) and PbMg1/3Nb2/3O3-PbTiO3 (PMN-PT) films are investigated by interferometric technique combined with conventional dielectric and polarization measurements. It is shown that the piezoelectric d33 coefficient of both materials can be expressed based on their polarization and dielectric constant values using an equation for the electrostriction biased by the polarization. The obtained values of electrostriction coefficients are nearly field-independent and significantly smaller than in bulk materials of the same composition. Polarization offset is observed in PZT films subjected to bipolar fatigue, UV illumination and poling at high temperature, and is explained based on the pinning of ferroelectric domains in preferred orientations. The piezoelectric properties of rhombohedral PZT films are found to depend on their texture. The highest piezoelectric coefficient is observed in (100) oriented films, which have smaller polarization as compared to films having (111) preferred orientation. This difference is explained by the different values of electrostriction coefficients in materials with different textures.

Original languageAmerican English
Pages (from-to)623-628
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
StatePublished - 1999
EventProceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998' - Boston, MA, USA
Duration: Nov 30 1998Dec 3 1998

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this