In Situ Electrical and Mechanical Characterization of individual Nickel Nanowires utilizing Dural Beam Focused Ion Beam and Nanomanipulator Systems

Ming Jin, Shiyou Xu, Grorge Abyad, Gerald Pointer, Nan Yao

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)790-791
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberS2
StatePublished - Jul 2012

All Science Journal Classification (ASJC) codes

  • Instrumentation

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