Indirect Testing of Digital-Correction Circuits in Analog-to-Digital Converters with Redundancy

Stephen H. Lewis, R. Ramachandran, W. Martin Snelgrove

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

This paper presents a study of indirect fault testing of digital-correction circuits that operate as a part of analog-to-digital converters with redundancy. Design and test techniques that improve the fault coverage are described. The limitations of these techniques and methods to overcome these limitations are presented.

Original languageEnglish (US)
Pages (from-to)437-445
Number of pages9
JournalIEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing
Volume42
Issue number7
DOIs
StatePublished - Jul 1995
Externally publishedYes

ASJC Scopus subject areas

  • Signal Processing
  • Electrical and Electronic Engineering

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