Mid-infrared reflectivity and ellipsometry measurements on single-crystal YBa2Cu3O7 and Bi2Sr2CuO6+y

Yukio Watanabe, Z. Z. Wang, Stephen Aplin Lyon, D. C. Tsui, Nai Phuan Ong, J. M. Tarascon, P. Barboux

Research output: Contribution to journalArticle

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Abstract

We have measured the room-temperature reflectivity of 90-K single crystals YBa2Cu3O7 in the frequency range 6009000 cm-1. The reflectivity R in these highly conducting samples (ab=150 cm at 290 K) is found to be higher than in previous reports. We fit R to a simple Drude-Lorentz model and compare the fit parameters with the dc transport values. (The effective-mass ratio of the carriers is found to be 2.0, and the scattering rate Latin small letter h with stroke/ is 3.1kBT at room temperature.) Ellipsometry measurements have also been performed using transverse-electric and transverse-magnetic polarizations. The dielectric dispersion derived from ellipsometry shows some important deviations from the Drude-Lorentz model. Reflectivity data from nonsuperconducting crystals of Bi2Sr2CuO6+y are also reported.

Original languageEnglish (US)
Pages (from-to)6884-6889
Number of pages6
JournalPhysical Review B
Volume40
Issue number10
DOIs
StatePublished - Jan 1 1989

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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