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Multi-order Scaling of High-throughput Transmission Electron Microscopy

  • Christopher S. Own
  • , Theodore DeRego
  • , Lawrence S. Own
  • , Gerward Weppelman
  • , Adrian A. Wanner
  • , Sebastian Ströh
  • , Eric Hammerschmith
  • , Ashwin Vishwanathan
  • , H. Sebastian Seung

Research output: Contribution to journal › Article › peer-review

Original languageEnglish (US)
Pages (from-to)1040-1041
Number of pages2
JournalMicroscopy and Microanalysis
Volume25
DOIs
StatePublished - Aug 1 2019

ASJC Scopus subject areas

  • Instrumentation

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