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On drift parameter estimation for reflected fractional Ornstein–Uhlenbeck processes
Chihoon Lee
, Jian Song
School of Business
Stevens Institute of Technology
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peer-review
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Dive into the research topics of 'On drift parameter estimation for reflected fractional Ornstein–Uhlenbeck processes'. Together they form a unique fingerprint.
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Keyphrases
Maximum Likelihood Estimator
100%
Ornstein-Uhlenbeck Process
100%
Drift Parameter
100%
Drift Parameter Estimation
100%
Mean Square Error
50%
Asymptotic Normality
50%
Explicit Formula
50%
Improved Estimator
50%
Continuous Observation
50%
Mean Squared Error
50%
Fractional Brownian Motion
50%
Girsanov Theorem
50%
Strong Consistency
50%
Hurst Parameter
50%
Precision Level
50%
Strong Asymptotics
50%
Mathematics
drift parameter μ
100%
Parameter Estimation
100%
Maximum Likelihood Estimator
66%
Asymptotic Normality
33%
Mean Square Error
33%
Explicit Formula
33%
Squared Error
33%
Fractional Brownian Motion
33%
Hurst Parameter
33%