Optimal sequential ALT plans for systems with mixture of one-shot units

Yao Cheng, Elsayed A. Elsayed

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

In this paper, we investigate a system composed of mixtures of one-shot units with nonhomogeneous and time-dependent characteristics. We propose analytical expressions to predict system reliability metrics and consider a physics-statistics-based lifetime model to demonstrate the units’ failure mechanism as well as its failure process uncertainty. We design a sequence of optimum accelerated non-destructive testing (NDT) plans to predict the reliability metrics of the system and show that a well-designed sequential accelerated NDTs is an effective approach to shorten the test duration with negligible consequence on system reliability metrics.

Original languageEnglish (US)
Pages (from-to)997-1011
Number of pages15
JournalIEEE Transactions on Reliability
Volume66
Issue number4
DOIs
StatePublished - Dec 2017

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

Keywords

  • Nonhomogeneous
  • One-shot units
  • Physics-statistics-based model
  • Sampling
  • Sequential accelerated nondestructive testing (NDT) plans
  • System reliability metrics

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