Abstract
Entangled two-photon absorption (ETPA) exhibits a quantum-enhanced two-photon absorption cross-section and a linear scaling with incident power that exceeds classical two-photon absorption (TPA) at low photon flux. Here, we assess the feasibility and applications of ETPA for active plasma spectroscopy. The ETPA-absorbed power for an Ar+ species in a helicon plasma scenario is calculated to be as high as 0.6 nW cm−1 along the incident beam path for nondegenerate-entangled photon pairs that are near-resonant with an intermediate level. The ETPA absorption power exceeds classical TPA and Bremsstrahlung emission, a necessary condition for a feasible fluorescence measurement. Applications of ETPA plasma spectroscopy may include trace impurity detection, ground-state excitation, and continuous-wave pumping for high-bandwidth turbulence measurements. Possible benefits of plasma measurements are less harm to optical components with lower incident flux and reduced stray light that can contaminate optical diagnostics.
| Original language | English (US) |
|---|---|
| Article number | 505204 |
| Journal | Journal of Physics D: Applied Physics |
| Volume | 58 |
| Issue number | 50 |
| DOIs | |
| State | Published - Dec 15 2025 |
| Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Acoustics and Ultrasonics
- Surfaces, Coatings and Films
Keywords
- active plasma spectroscopy
- entangled two photon absorption
- laser-aided plasma diagnostics
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