Progression of left ventricular wall thickness during pressure-overload left ventricular hypertrophy

Minjie Feng, John K.J. Li, Kenneth Khaw, Gary M. Drzewiecki

Research output: Contribution to journalConference articlepeer-review

Abstract

Pressure-overload in terms of decreased arterial compliance (C) and increased vascular resistance (Rs) was used in conjunction with a negative feedback control model to predict left ventricular (LV) wall thickness growth over a prescribed time period. The progression of left ventricular wall thickness growth was found to change proportionally with the peak systolic pressure and the extent of the combination of a reduction in C and an increase in Rs.

Original languageEnglish (US)
Pages (from-to)1222-1223
Number of pages2
JournalAnnual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings
Volume2
StatePublished - 2002
EventProceedings of the 2002 IEEE Engineering in Medicine and Biology 24th Annual Conference and the 2002 Fall Meeting of the Biomedical Engineering Society (BMES / EMBS) - Houston, TX, United States
Duration: Oct 23 2002Oct 26 2002

ASJC Scopus subject areas

  • Signal Processing
  • Biomedical Engineering
  • Computer Vision and Pattern Recognition
  • Health Informatics

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