Rapid broadband discrete nanomechanical mapping on atomic force microscope

Jingren Wang, Qingze Zou, Chanmin Su

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

In this paper, an approach for rapid broadband discrete nanomechanical mapping of soft samples using atomic force microscope is proposed. Nanomechanical mapping is needed to investigate, the spatial distribution of nanomechanical properties with dynamic evolution-provided that the mapping is fast enough. To enhance the mapping efficiency, we propose to significantly reduce the number of measurements by only implementing the technique at locations of interest, which further enables the broadband nanomechanical property study of soft samples undergoing dynamic processes. Firstly, an online searching learning-based optimization scheme is proposed to achieve the rapid probe engagement and withdrawal with minimum probe-sample interaction forces at each sample location. Then, a decomposition-based learning approach is used to achieve the rapid probe transition between sample locations. The proposed technique is demonstrated through multiple-location viscoelasticity measurements on a Polydimethylsiloxane (PDMS) sample in AFM experiment.

Original languageEnglish (US)
Title of host publication2019 American Control Conference, ACC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2227-2232
Number of pages6
ISBN (Electronic)9781538679265
DOIs
StatePublished - Jul 2019
Event2019 American Control Conference, ACC 2019 - Philadelphia, United States
Duration: Jul 10 2019Jul 12 2019

Publication series

NameProceedings of the American Control Conference
Volume2019-July

Conference

Conference2019 American Control Conference, ACC 2019
CountryUnited States
CityPhiladelphia
Period7/10/197/12/19

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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