TY - GEN
T1 - Resonance suppression on nanoscale viscoelasticity measurement
AU - Xie, Ping
AU - Zhang, Lei
AU - Zou, Qing ze
PY - 2012
Y1 - 2012
N2 - During the broadband viscoelasticity measurement process, when the frequency of the excitation force become high relative to the resonant frequency or the bandwidth of the instrument dynamics, the adverse instrument dynamics is motivated, which causes the cantilever resonance and generates large measurement errors in the measurement data. To solve this problem, an approach to suppress the cantilever resonance on the broadband viscoelasticity measurement is proposed. Firstly, Atomic force microscope (AFM) system dynamic is analyzed by using a dynamic signal analyzer (DSA) in the z-axis. And a notch filter is designed as a prefilter of the AFM system to filter the input drive voltage in order to offset the resonance peak in the AFM model. Secondly, an adaptive filter based on LMS is designed to further eliminate the residual cantilever resonance effects on the complex compliance of soft materials, referring to the Hertz contact model. Finally, the proposed approach is illustrated by implementing it to remove the cantilever resonance effects on the broadband viscoelasticity measurement of a polydimethylsiloxane (PDMS) sample using AFM.
AB - During the broadband viscoelasticity measurement process, when the frequency of the excitation force become high relative to the resonant frequency or the bandwidth of the instrument dynamics, the adverse instrument dynamics is motivated, which causes the cantilever resonance and generates large measurement errors in the measurement data. To solve this problem, an approach to suppress the cantilever resonance on the broadband viscoelasticity measurement is proposed. Firstly, Atomic force microscope (AFM) system dynamic is analyzed by using a dynamic signal analyzer (DSA) in the z-axis. And a notch filter is designed as a prefilter of the AFM system to filter the input drive voltage in order to offset the resonance peak in the AFM model. Secondly, an adaptive filter based on LMS is designed to further eliminate the residual cantilever resonance effects on the complex compliance of soft materials, referring to the Hertz contact model. Finally, the proposed approach is illustrated by implementing it to remove the cantilever resonance effects on the broadband viscoelasticity measurement of a polydimethylsiloxane (PDMS) sample using AFM.
KW - Adaptive filter
KW - Atomic force microscope
KW - Notch filter
KW - The least mean square rule
KW - Viscoelasticity measurement
UR - http://www.scopus.com/inward/record.url?scp=84867829865&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84867829865&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/AMR.528.75
DO - 10.4028/www.scientific.net/AMR.528.75
M3 - Conference contribution
SN - 9783037854297
T3 - Advanced Materials Research
SP - 75
EP - 79
BT - Frontier of Nanoscience and Technology II
T2 - 2012 International Conference on Frontier of Nanoscience and Technology, ICFNST 2012
Y2 - 26 July 2012 through 27 July 2012
ER -