Salvaging test windows in BIST diagnostics

Research output: Contribution to conferencePaper

18 Scopus citations

Abstract

This paper uses the STUMPS architecture to study the properties of a new diagnostic procedure. According to the old procedure the process stops at the end of each test window to compare the measured signature against its precomputed value. The old procedure also calls for the abandonment of all future test windows after the first failing one is encountered. This is due to the unavailability of expected future test window signatures in the presence of a previously captured error. This paper shows a simple method of salvaging future test windows by adjusting their expected signatures to fit past observed errors. Experiments conducted using this new procedure reveals an improvement of at least one order of magnitude in diagnostic resolution over what has been previously experienced.

Original languageEnglish (US)
Pages416-425
Number of pages10
StatePublished - Jan 1 1997
EventProceedings of the 1997 15th VLSI Test Symposium - Monterey, CA, USA
Duration: Apr 27 1997May 1 1997

Other

OtherProceedings of the 1997 15th VLSI Test Symposium
CityMonterey, CA, USA
Period4/27/975/1/97

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Computer Science Applications

Cite this

Savir, J. (1997). Salvaging test windows in BIST diagnostics. 416-425. Paper presented at Proceedings of the 1997 15th VLSI Test Symposium, Monterey, CA, USA, .