Short term adaptation of disparity vergence: A suppressive stimulus study

T. Sims, T. Alvarez, J. Semmlow

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Adaptation is the modification of structure or form due to environmental conditions. It is a key aspect of species survival and is found in most major physiological systems. This study analyzed adaptive effects of the vergence system using an infrared limbus-tracking device to record eye movements. Specifically, this study investigated how small steps of 1 degree influence 4, and 8 degree steps. Adaptation was observed in the two subjects studied as noted by the decrease in velocity of vergence eye movements.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE 28th Annual Northeast Bioengineering Conference, NEBC 2002
EditorsDalia El-Sherif, Karen Moxon, Saravanan Kanakasabai
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages51-52
Number of pages2
ISBN (Electronic)0780374193
DOIs
StatePublished - Jan 1 2002
Event28th IEEE Annual Northeast Bioengineering Conference, NEBC 2002 - Philadelphia, United States
Duration: Apr 20 2002Apr 21 2002

Publication series

NameProceedings of the IEEE Annual Northeast Bioengineering Conference, NEBEC
Volume2002-January

Other

Other28th IEEE Annual Northeast Bioengineering Conference, NEBC 2002
CountryUnited States
CityPhiladelphia
Period4/20/024/21/02

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All Science Journal Classification (ASJC) codes

  • Bioengineering

Keywords

  • Biomedical engineering
  • Biomedical imaging
  • Displays
  • Eyes
  • Fuses
  • Nervous system
  • Open loop systems
  • Retina
  • Surgery
  • Turning

Cite this

Sims, T., Alvarez, T., & Semmlow, J. (2002). Short term adaptation of disparity vergence: A suppressive stimulus study. In D. El-Sherif, K. Moxon, & S. Kanakasabai (Eds.), Proceedings of the IEEE 28th Annual Northeast Bioengineering Conference, NEBC 2002 (pp. 51-52). [999460] (Proceedings of the IEEE Annual Northeast Bioengineering Conference, NEBEC; Vol. 2002-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NEBC.2002.999460