Shrinking Wide Compressors

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Quite often built-in self-test (BIST) designs make use of multiple-input signature registers (MISR's) to compress the test data. Normally a MISR includes a stage for every signal that it is sampling. In some applications this leads to very wide MISR's that may include several hundred stages. Wide MISR's pose problems in terms of hardware and wiring overhead. Shorter compressors are, therefore, needed. This paper investigates the problem of shrinking an MISR so that it samples multiple signals at every stage. The ultimate shrinkage occurs when only the parity of the sampled signals is compressed. This is the case when a MISR is replaced by a single-input signature register (SISR). Issues like detection probability loss, test length penalty, and fault coverage degradation are some of the disadvantages that may arise from the MISR shrinkage. Minimizing the effect of these issues is a precondition to the success of this method.

Original languageEnglish (US)
Pages (from-to)1379-1387
Number of pages9
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume14
Issue number11
DOIs
StatePublished - Jan 1 1995
Externally publishedYes

Fingerprint

Compressors
Built-in self test
Electric wiring
Sampling
Hardware
Degradation

All Science Journal Classification (ASJC) codes

  • Software
  • Electrical and Electronic Engineering
  • Computer Graphics and Computer-Aided Design

Cite this

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title = "Shrinking Wide Compressors",
abstract = "Quite often built-in self-test (BIST) designs make use of multiple-input signature registers (MISR's) to compress the test data. Normally a MISR includes a stage for every signal that it is sampling. In some applications this leads to very wide MISR's that may include several hundred stages. Wide MISR's pose problems in terms of hardware and wiring overhead. Shorter compressors are, therefore, needed. This paper investigates the problem of shrinking an MISR so that it samples multiple signals at every stage. The ultimate shrinkage occurs when only the parity of the sampled signals is compressed. This is the case when a MISR is replaced by a single-input signature register (SISR). Issues like detection probability loss, test length penalty, and fault coverage degradation are some of the disadvantages that may arise from the MISR shrinkage. Minimizing the effect of these issues is a precondition to the success of this method.",
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Shrinking Wide Compressors. / Savir, Jacob.

In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 14, No. 11, 01.01.1995, p. 1379-1387.

Research output: Contribution to journalArticle

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