Simulation of noise processes in thickness-shear resonators caused by multilayer adsorption and desorption of surface molecules

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Abstract

The effects of multilayer contamination of mean resonant frequency and frequency fluctuations in thickness-shear resonators are studied. A model based on mass-loading of contaminant molecules with adsorption and desorption rates is developed. Equations relating the change in mean frequency and frequency fluctuations to adsorption and desorption rates are derived. Since the adsorption and desorption rates are functions of pressure and temperature, the change in mean frequency and spectral density of frequency fluctuations is studied with respect to pressure and temperature. Calculations are performed for a 10 MHz thickness-shear resonator. Frequency-temperature and frequency-pressure curves are plotted for the 10 MHz resonator. The curves do not follow a cubic polynomial function and have a magnitude in the range of 10 ppm. The mean square of frequency fluctuations under multilayer contamination is significantly greater than that under monolayer contamination. The spectral density of frequency fluctuations at 1 Hz is quite constant in a wide range of temperatures (-50 to 100°C) when the values of heat of absorption for the second and subsequent layers are close to that of the first layer. The magnitude of spectral density of frequency fluctuations is about -120 dBc (Hz2/Hz).

Original languageEnglish (US)
Pages (from-to)387-393
Number of pages7
JournalProceedings of the Annual IEEE International Frequency Control Symposium
StatePublished - May 1 1990
EventProceedings of the 44th Annual Symposium on Frequency Control 1990 - Baltimore, MD, USA
Duration: May 23 1990May 25 1990

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desorption
resonators
shear
adsorption
molecules
simulation
contamination
temperature
curves
contaminants
resonant frequencies
polynomials
heat

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Control and Systems Engineering

Cite this

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title = "Simulation of noise processes in thickness-shear resonators caused by multilayer adsorption and desorption of surface molecules",
abstract = "The effects of multilayer contamination of mean resonant frequency and frequency fluctuations in thickness-shear resonators are studied. A model based on mass-loading of contaminant molecules with adsorption and desorption rates is developed. Equations relating the change in mean frequency and frequency fluctuations to adsorption and desorption rates are derived. Since the adsorption and desorption rates are functions of pressure and temperature, the change in mean frequency and spectral density of frequency fluctuations is studied with respect to pressure and temperature. Calculations are performed for a 10 MHz thickness-shear resonator. Frequency-temperature and frequency-pressure curves are plotted for the 10 MHz resonator. The curves do not follow a cubic polynomial function and have a magnitude in the range of 10 ppm. The mean square of frequency fluctuations under multilayer contamination is significantly greater than that under monolayer contamination. The spectral density of frequency fluctuations at 1 Hz is quite constant in a wide range of temperatures (-50 to 100°C) when the values of heat of absorption for the second and subsequent layers are close to that of the first layer. The magnitude of spectral density of frequency fluctuations is about -120 dBc (Hz2/Hz).",
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AU - Yong, Yook-Kong

PY - 1990/5/1

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N2 - The effects of multilayer contamination of mean resonant frequency and frequency fluctuations in thickness-shear resonators are studied. A model based on mass-loading of contaminant molecules with adsorption and desorption rates is developed. Equations relating the change in mean frequency and frequency fluctuations to adsorption and desorption rates are derived. Since the adsorption and desorption rates are functions of pressure and temperature, the change in mean frequency and spectral density of frequency fluctuations is studied with respect to pressure and temperature. Calculations are performed for a 10 MHz thickness-shear resonator. Frequency-temperature and frequency-pressure curves are plotted for the 10 MHz resonator. The curves do not follow a cubic polynomial function and have a magnitude in the range of 10 ppm. The mean square of frequency fluctuations under multilayer contamination is significantly greater than that under monolayer contamination. The spectral density of frequency fluctuations at 1 Hz is quite constant in a wide range of temperatures (-50 to 100°C) when the values of heat of absorption for the second and subsequent layers are close to that of the first layer. The magnitude of spectral density of frequency fluctuations is about -120 dBc (Hz2/Hz).

AB - The effects of multilayer contamination of mean resonant frequency and frequency fluctuations in thickness-shear resonators are studied. A model based on mass-loading of contaminant molecules with adsorption and desorption rates is developed. Equations relating the change in mean frequency and frequency fluctuations to adsorption and desorption rates are derived. Since the adsorption and desorption rates are functions of pressure and temperature, the change in mean frequency and spectral density of frequency fluctuations is studied with respect to pressure and temperature. Calculations are performed for a 10 MHz thickness-shear resonator. Frequency-temperature and frequency-pressure curves are plotted for the 10 MHz resonator. The curves do not follow a cubic polynomial function and have a magnitude in the range of 10 ppm. The mean square of frequency fluctuations under multilayer contamination is significantly greater than that under monolayer contamination. The spectral density of frequency fluctuations at 1 Hz is quite constant in a wide range of temperatures (-50 to 100°C) when the values of heat of absorption for the second and subsequent layers are close to that of the first layer. The magnitude of spectral density of frequency fluctuations is about -120 dBc (Hz2/Hz).

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