Simultaneous multi-wavelength laser spot detection and beam wander measurement using novel polymer imaging system

Prajnesh Kumar, Ting Bu, Dayu Zhang, Rainer Martini

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Comparison of optical propagation properties in different wavelength regimes are difficult to measure, especially in continuous varying environment. Detector and measurement equipment are typically optimized for specific spectral band and utilize matching amplifiers with have different response and process time making it hard or impossible to match time sensitive data. In this paper we propose the use of a wavelength conversion imaging system which has a broad spectral response and large detector size for synchronous multi-wavelength measurement. We showcase the strength of this approach in comparing the effect of turbulence media on a 1.55 μm and a 4 μm lasers at ambient (20 °C), 45 °C and 75 °C air temperature. Recording the movement and size of the lasers spot and comparing it frame to frame allows for extraction of the effect of turbulence on the individual lasers. Furthermore using cross correlation technique the conditions under which a good comparison can be identified. The result shows peak at 0s time shift for 45 °C and 75 °C which confirms the correlated measurement while the beam wander shows no correlation for ambient temperature as it is random.

Original languageEnglish
Title of host publicationImage Sensing Technologies
Subtitle of host publicationMaterials, Devices, Systems, and Applications VI
EditorsNibir K. Dhar, Achyut K. Dutta, Sachidananda R. Babu
PublisherSPIE
ISBN (Electronic)9781510626256
DOIs
StatePublished - 2019
EventImage Sensing Technologies: Materials, Devices, Systems, and Applications VI 2019 - Baltimore, United States
Duration: Apr 15 2019Apr 16 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10980

Conference

ConferenceImage Sensing Technologies: Materials, Devices, Systems, and Applications VI 2019
Country/TerritoryUnited States
CityBaltimore
Period4/15/194/16/19

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Keywords

  • Beam wander measurement
  • Correlated measurement
  • Infrared imaging system
  • Mid-infrared
  • Scattering
  • Scintillation
  • Short wave infrared
  • Turbulence

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