Size-dependent phase transformations during point loading of silicon

Adrian Mann, D. Van Heerden, J. B. Pethica, T. P. Weihs

Research output: Contribution to journalArticle

87 Citations (Scopus)

Abstract

Using a unique combination of in situ electrical and acoustical measurements and ex situ transmission electron microscopy, the phase transformations of silicon during point loading were shown to exhibit a strong dependence on the size of the deformed volume. For nanometer-size volumes of silicon, the final phase was the body centered cubic structure BC8, but for larger volumes it was amorphous. The size dependence was explained by considering how shear stress fields vary with contact size and how interfacial effects between the silicon substrate and the BC8 phase determine its stability. For both small and large contacts the presence of a nonmetallic phase (assumed to be the Rhombohedral structure R8) was observed.

Original languageEnglish (US)
Pages (from-to)1754-1758
Number of pages5
JournalJournal of Materials Research
Volume15
Issue number8
DOIs
StatePublished - Jan 1 2000
Externally publishedYes

Fingerprint

Silicon
phase transformations
Phase transitions
silicon
Shear stress
electrical measurement
shear stress
stress distribution
Transmission electron microscopy
Substrates
transmission electron microscopy

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Materials Science(all)

Cite this

Mann, Adrian ; Van Heerden, D. ; Pethica, J. B. ; Weihs, T. P. / Size-dependent phase transformations during point loading of silicon. In: Journal of Materials Research. 2000 ; Vol. 15, No. 8. pp. 1754-1758.
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Size-dependent phase transformations during point loading of silicon. / Mann, Adrian; Van Heerden, D.; Pethica, J. B.; Weihs, T. P.

In: Journal of Materials Research, Vol. 15, No. 8, 01.01.2000, p. 1754-1758.

Research output: Contribution to journalArticle

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