Structural and electrochemical studies on thin-film yttria-doped zirconia electrolytes for microscale solid oxide fuel cells

Alex C. Johnson, Shriram Ramanathan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report in-plane and through-plane conductivity measurements of dense YSZ films varying in thickness from 20 to 200 nm. In-plane measurements were performed on YSZ films grown on silicon wafers coated with SiO2 or Si3N4. Micro-fabricated strips with Pt electrodes in various geometries were used to obtain conductivity as a function of temperature from 200 - 600 °C in a custom-designed micro-probe station. These films have activation energies, which vary from 0.77 to 1.09 eV. Their absolute conductivity is lower compared with other reports. Through-plane and fuel cell measurements were performed by depositing YSZ on a nitrided silicon wafer, then etching through the wafer and depositing porous platinum electrodes on both sides [6,7]. We discuss the electrochemical conduction studies in detail along with fuel cell performance and correlation with electrode microstructure.

Original languageAmerican English
Title of host publication2008 Proceedings of 3rd Energy Nanotechnology International Conference, ENIC 2008
Pages23-24
Number of pages2
StatePublished - 2009
Externally publishedYes
Event2008 3rd Energy Nanotechnology International Conference, ENIC 2008 - Jacksonville, FL, United States
Duration: Aug 10 2008Aug 14 2008

Publication series

Name2008 Proceedings of 3rd Energy Nanotechnology International Conference, ENIC 2008

Conference

Conference2008 3rd Energy Nanotechnology International Conference, ENIC 2008
Country/TerritoryUnited States
CityJacksonville, FL
Period8/10/088/14/08

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Mechanical Engineering

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