Synthesis of Radiation Counts for Networks of Detectors

Satyabrata Sen, Nageswara S.V. Rao, Mark L. Berry, Kayla M. Grieme, Chase Q. Wu, Guthrie Cordone, Richard R. Brooks

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We develop a data-driven, regression-based scaling method to synthesize radiation counts for a given source strength in a spectral bin by bootstrapping measurements from Domestic Nuclear Detection Office's Intelligence Radiation Sensors Systems (IRSS) tests. In addition to counts, we also generate network messages using message-skeletons extracted from IRSS tests. We characterize the quality of generated counts using statistical mea- sures and distance metrics, and provide an analytical justification for our method based on the Vapnik-Chervonenkis theory.

Original languageEnglish (US)
Title of host publication2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538622827
DOIs
StatePublished - Nov 12 2018
Event2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Atlanta, United States
Duration: Oct 21 2017Oct 28 2017

Publication series

Name2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings

Other

Other2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017
CountryUnited States
CityAtlanta
Period10/21/1710/28/17

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation
  • Radiology Nuclear Medicine and imaging

Cite this

Sen, S., Rao, N. S. V., Berry, M. L., Grieme, K. M., Wu, C. Q., Cordone, G., & Brooks, R. R. (2018). Synthesis of Radiation Counts for Networks of Detectors. In 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings [8532854] (2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2017.8532854