The compound class of Weibull power series for reliability application

Minjae Park, Hoang Pham

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

- In this study, we introduce a new class of distributions by compounding the exponentiated Weibull family and vtub-shaped failure rate for system. This combined class of distributions can be applied to reliability applications using the field data and mathematical properties of combined distributions are studied including order statistics. Using maximum likelihood estimation, point estimates and interval estimation for parameters have been obtained. We develop novel approach to measure reliability of parallel systems as well as single component system and illustrate the usefulness of proposed approach. Numerical examples are discussed for the applicability of the methodology derived in the paper.

Original languageEnglish (US)
Title of host publicationProceedings - 25th ISSAT International Conference on Reliability and Quality in Design
EditorsHoang Pham
PublisherInternational Society of Science and Applied Technologies
Pages272-276
Number of pages5
ISBN (Electronic)9780991057672
StatePublished - Jan 1 2019
Event25th ISSAT International Conference on Reliability and Quality in Design, RQD 2019 - Las Vegas, United States
Duration: Aug 1 2019Aug 3 2019

Publication series

NameProceedings - 25th ISSAT International Conference on Reliability and Quality in Design

Conference

Conference25th ISSAT International Conference on Reliability and Quality in Design, RQD 2019
Country/TerritoryUnited States
CityLas Vegas
Period8/1/198/3/19

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality

Keywords

  • Combined distribution
  • Maximum likelihood estimation
  • Multi-component system
  • Power series class
  • Reliability function
  • Vtub-shaped failure rate

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