The deep lens survey

D. Wittman, J. A. Tyson, I. P. Dell'Antonio, A. C. Becker, V. E. Margoniner, J. Cohen, D. Norman, D. Loomba, G. Squires, G. Wilson, C. Stubbs, J. Hennawi, David N. Spergel, P. Boeshaar, A. Clocchiatt, M. Hamuy, G. Bernstein, A. Gonzalez, P. Guhathakurta, W. HuU. Seljak, D. Zaritsky

Research output: Contribution to journalConference article

79 Scopus citations

Abstract

The Deep Lens Survey (DLS) is a deep BV Rz′ imaging survey of seven 2° × 2° degree fields, with all data to be made public. The primary scientific driver is weak gravitational lensing, but the survey is also designed to enable a wide array of other astrophysical investigations. A unique feature of this survey is the search for transient phenomena. We subtract multiple exposures of a field, detect differences, classify, and release transients on the Web within about an hour of observation. Here we summarize the scientific goals of the DLS, field and filter selection, observing techniques and current status, data reduction, data products and release, and transient detections. Finally, we discuss some lessons which might apply to future large surveys such as LSST.

Original languageEnglish (US)
Pages (from-to)73-82
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4836
DOIs
StatePublished - Dec 1 2002
EventSurvey and Other Telescope Technologies and Discoveries - Waikoloa, HI, United States
Duration: Aug 27 2002Aug 28 2002

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Applied Mathematics
  • Electrical and Electronic Engineering
  • Computer Science Applications

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    Wittman, D., Tyson, J. A., Dell'Antonio, I. P., Becker, A. C., Margoniner, V. E., Cohen, J., Norman, D., Loomba, D., Squires, G., Wilson, G., Stubbs, C., Hennawi, J., Spergel, D. N., Boeshaar, P., Clocchiatt, A., Hamuy, M., Bernstein, G., Gonzalez, A., Guhathakurta, P., ... Zaritsky, D. (2002). The deep lens survey. Proceedings of SPIE - The International Society for Optical Engineering, 4836, 73-82. https://doi.org/10.1117/12.457348