Abstract
A technique for the measurement of in-plane thermal conductivity of the thin-film superlattice structure in the giant magnetoresistance (GMR) head for data storage systems was proposed. The film was deposited on a silicon dioxide layer of thickness near 1 micron which acted as a thermal barrier. The maximum measurement sensitivity was achieved through the optimized geometric design of the structure from the sensitivity analysis. The results show that the in-plane thermal conductivity of the thin film overlayer can be extracted by comparing the measured average temperature rise in metal bridge.
Original language | English (US) |
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Pages (from-to) | 195-197 |
Number of pages | 3 |
Journal | American Society of Mechanical Engineers, Heat Transfer Division, (Publication) HTD |
Volume | 372 |
Issue number | 2 |
DOIs | |
State | Published - 2002 |
Externally published | Yes |
Event | 2002 ASME International Mechanical Engineering Congress and Exposition - New Orleans, LA, United States Duration: Nov 17 2002 → Nov 22 2002 |
ASJC Scopus subject areas
- Mechanical Engineering
- Fluid Flow and Transfer Processes