Thermal Property Measurements of Giant Magnetoresistive (GMR) Layers

Yizhang Yang, W. Liu, S. Shojaeizadeh, S. Zhang, M. Asheghi

Research output: Contribution to journalConference articlepeer-review

Abstract

A technique for the measurement of in-plane thermal conductivity of the thin-film superlattice structure in the giant magnetoresistance (GMR) head for data storage systems was proposed. The film was deposited on a silicon dioxide layer of thickness near 1 micron which acted as a thermal barrier. The maximum measurement sensitivity was achieved through the optimized geometric design of the structure from the sensitivity analysis. The results show that the in-plane thermal conductivity of the thin film overlayer can be extracted by comparing the measured average temperature rise in metal bridge.

Original languageEnglish (US)
Pages (from-to)195-197
Number of pages3
JournalAmerican Society of Mechanical Engineers, Heat Transfer Division, (Publication) HTD
Volume372
Issue number2
DOIs
StatePublished - 2002
Externally publishedYes
Event2002 ASME International Mechanical Engineering Congress and Exposition - New Orleans, LA, United States
Duration: Nov 17 2002Nov 22 2002

ASJC Scopus subject areas

  • Mechanical Engineering
  • Fluid Flow and Transfer Processes

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