TY - JOUR
T1 - Uniform patterned growth of carbon nanotubes without surface carbon
AU - Teo, K. B.K.
AU - Amaratunga, G. A.J.
AU - Milne, W. I.
AU - Hasko, D. G.
AU - Pirio, G.
AU - Legagneux, P.
AU - Wyczisk, F.
AU - Pribat, D.
PY - 2001/9/3
Y1 - 2001/9/3
N2 - In order to utilize the unique properties of carbon nanotubes in microelectronic devices, it is necessary to develop a technology which enables high yield, uniform, and preferential growth of perfectly aligned nanotubes. We demonstrate such a technology by using plasma-enhanced chemical-vapor deposition (PECVD) of carbon nanotubes. By patterning the nickel catalyst, we have deposited uniform arrays of nanotubes and single free-standing aligned nanotubes at precise locations. In the PECVD process, however, detrimental amorphous carbon (a-C) is also deposited over regions of the substrate surface where the catalyst is absent. Here, we show, using depth-resolved Auger electron spectroscopy, that by employing a suitable deposition (acetylene, C2H2) to etching (ammonia, NH3) gas ratio, it is possible to obtain nanotube growth without the presence of a-C on the substrate surface.
AB - In order to utilize the unique properties of carbon nanotubes in microelectronic devices, it is necessary to develop a technology which enables high yield, uniform, and preferential growth of perfectly aligned nanotubes. We demonstrate such a technology by using plasma-enhanced chemical-vapor deposition (PECVD) of carbon nanotubes. By patterning the nickel catalyst, we have deposited uniform arrays of nanotubes and single free-standing aligned nanotubes at precise locations. In the PECVD process, however, detrimental amorphous carbon (a-C) is also deposited over regions of the substrate surface where the catalyst is absent. Here, we show, using depth-resolved Auger electron spectroscopy, that by employing a suitable deposition (acetylene, C2H2) to etching (ammonia, NH3) gas ratio, it is possible to obtain nanotube growth without the presence of a-C on the substrate surface.
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U2 - https://doi.org/10.1063/1.1400085
DO - https://doi.org/10.1063/1.1400085
M3 - Article
SN - 0003-6951
VL - 79
SP - 1534
EP - 1536
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 10
ER -