| Original language | American English |
|---|---|
| Pages | 102-109 |
| Number of pages | 8 |
| State | Published - 1981 |
| Externally published | Yes |
ASJC Scopus subject areas
- General Engineering
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VLSI SELF-TESTING BASED ON SYNDROME TECHNIQUES.
- Z. Barzilai
- , J. Savir
- , G. Markowsky
- , M. G. Smith
Research output: Contribution to conference › Paper › peer-review
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