Wide Bandgap Materials for Semiconductor Devices

Research output: Contribution to journal › Editorial › peer-review

Original language	American English
Pages (from-to)	306
Number of pages	1
Journal	Microelectronics Reliability
Volume	91
DOIs	https://doi.org/10.1016/j.microrel.2018.10.010
State	Published - Dec 2018

ASJC Scopus subject areas

@article{c5180311528a4843873a5f2aad0ffbdf,

title = "Wide Bandgap Materials for Semiconductor Devices",

author = "Lee, \{Kuan Wei\} and Liu, \{Chuan Hsi\} and Durga Misra",

year = "2018",

month = dec,

doi = "10.1016/j.microrel.2018.10.010",

language = "American English",

volume = "91",

pages = "306",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

}

TY - JOUR

T1 - Wide Bandgap Materials for Semiconductor Devices

AU - Lee, Kuan Wei

AU - Liu, Chuan Hsi

AU - Misra, Durga

PY - 2018/12

Y1 - 2018/12

UR - https://www.scopus.com/pages/publications/85056880398

UR - https://www.scopus.com/pages/publications/85056880398#tab=citedBy

U2 - 10.1016/j.microrel.2018.10.010

DO - 10.1016/j.microrel.2018.10.010

M3 - Editorial

SN - 0026-2714

VL - 91

SP - 306

JO - Microelectronics Reliability

JF - Microelectronics Reliability

ER -